Modeling of a charged dielectric interface: Comparison of the continuum and discrete lattice representations of surface charges

被引:1
|
作者
Yuan, Jiaxing [1 ,2 ]
Wang, Yanwei [3 ,4 ]
机构
[1] Shanghai Jiao Tong Univ, Sch Phys & Astron, Shanghai 200240, Peoples R China
[2] Shanghai Jiao Tong Univ, Inst Nat Sci, Shanghai 200240, Peoples R China
[3] Nasscrrbayev Univ, Sch Engn, Dept Chem & Mat Engn, Astana 010000, Kazakhstan
[4] Jiangsu Sobute New Mat Co Ltd, State Key Lab High Performance Civil Engn Mat, Nanjing 211103, Jiangsu, Peoples R China
关键词
Charged interface; Discrete model; Continuum model; Image charge; Electrostatic;
D O I
10.1016/j.colcom.2019.100184
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Two main approaches in particle-based simulations for modeling a charged surface are using explicit, discrete charges and continuum, uniform charges. It is well-known that these two approaches could lead to substantially distinct ionic distributions, whereas a systematic exploration of the origin is still absent. In this short communication, we calculate the electrostatic force of a single point charge above a planar substrate characterized by a surface charge density and dielectric mismatch and compare the differences in the electrostatic forces produced by discrete and continuum representations of surface charges. We demonstrate that while the model of uniform surface charges gives a rather simple picture, the model of discrete surface charges can exhibit different scenarios, depending on the respective values of ion-surface distance versus lattice spacing and a self-image interaction parameter.
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页数:3
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