A MAIC approach to TFT-LCD panel quality improvement

被引:43
|
作者
Chen, K. S.
Wang, C. H.
Chen, H. T.
机构
[1] Chang Jung Univ, Dept Informat Management, Tainan, Taiwan
[2] Natl Chin Yi Univ Technol, Inst Prod Syst Engn & Management, Taichung 411, Taiwan
关键词
PROCESS CAPABILITY ANALYSIS;
D O I
10.1016/j.microrel.2005.10.003
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The liquid crystal displays (LCDs) possess the most mature technology and best consuming competitiveness in the flat panel display (FPD) industries. Of all the LCDs, thin film transistor-liquid crystal display (TFT-LCD) keeps some real advantages. It is thinner, smaller and lighter than other displays and has low power consumption, low-radiation, high-contrast and high-dpi at the same time. Hence, the TFT-LCD panel is widely applied in daily electronic products, and the demand for the TFT-LCD panel increases. The product life cycle of the TFT-LCD panel is gradually getting into the mature stage, and meanwhile, Taiwan's firms face fierce competition from South Korea and Japan. Thus, at present, continual cost reduction is an all-out pursuing topic for Taiwan's panel manufacturers. If the quality and yield of the TFT-LCD panel can be effectively enhanced, the non-conforming rate and the cost of the TFT-LCD panel will be reduced. In this study, TFT-LCD panel manufacturing process is discussed, and then five critical-to-quality (CTQ) characteristics (or sub-processes) are identified and summarized. At the early stages, the assessing model of process quality index (C-pm) and the MAIC (i.e., measure-analyze-improve-control) approach of Six Sigma are used to measure and analyze the CTQ characteristics that make TFT-LCD panel unqualified and incapable. During the later stages, Hartley's homogeneity test and joint confidence intervals were conducted to determine the optimal parameter setting of the critical factor in TFT-LCD panel manufacturing process. By using these optimal settings, Six Sigma quality level can be achieved. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1189 / 1198
页数:10
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