Simple and inexpensive time-of-flight charge-to-mass analyzer for ion beam source characterization

被引：66
|
作者：
Gushenets, V. I.
Nikolaev, A. G.
Oks, E. M.
Vintizenko, L. G.
Yushkov, G. Yu.
Oztarhan, A.
Brown, I. G.
机构：
[1] Russian Acad Sci, Inst High Current Elect, Tomsk 634055, Russia
[2] Ege Univ, TR-35100 Izmir, Turkey
[3] Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2006年 / 77卷 / 06期
关键词：
D O I：
10.1063/1.2206778
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We describe the design, electronics, and test results of a simple and low-cost time-of-flight ion charge-to-mass analyzer that is suitable for ion source characterization. The method selects a short-time sample of the beam whose charge-to-mass composition is then separated according to ion velocity and detected by a remote Faraday cup. The analyzer is a detachable device that has been used for rapid analysis of charge-to-mass composition of ion beams accelerated by voltages of up to about 100 kV.
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页数：3
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