Test pattern generation for combinatorial multi-valued networks based on generalized D-algorithm

被引：11
|
作者：
Shmerko, VP
Yanushkevich, S
Levashenko, V
机构：
来源：
27TH INTERNATIONAL SYMPOSIUM ON MULTIPLE-VALUED LOGIC - 1997 PROCEEDINGS | 1997年
关键词：
D O I：
10.1109/ISMVL.1997.601388
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A calculus for test pattern generation for Multi-Valued Logic (MVL) networks using so-called Direct D-cubes (DD-cubes) is proposed The conception of the DD-cubes is introduced based on Direct Logic Derivatives generated by matrix algorithm. It means a possibility to support the central stages of test generating on parallel hardware, for instance, linear systolic arrays.
引用
收藏
页码：139 / 144
页数：6
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