Photoenhanced wet oxidation of gallium nitride

被引:65
|
作者
Peng, LH [1 ]
Liao, CH
Hsu, YC
Jong, CS
Huang, CN
Ho, JK
Chiu, CC
Chen, CY
机构
[1] Natl Taiwan Univ, Dept Elect Engn, Taipei 10764, Taiwan
[2] Natl Taiwan Univ, Inst Electroopt Engn, Taipei 10764, Taiwan
[3] Ind Technol Res Inst, Optoelect & Syst Labs, Hsinchu, Taiwan
关键词
D O I
10.1063/1.125804
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigate the photo-oxidation process and the corresponding passivation effects on the optical properties of unintentionally doped n-type gallium nitride (GaN). When illuminated with a 253.7 nm mercury line source, oxidation of GaN is found to take place in aqueous phosphorus acid solutions with pH values ranging from 3 to 4. At room temperature, the photo-oxidation process is found reaction-rate limited and has a peak value of 224 nm/h at pH=3.5. Compared with the as-grown GaN layers, threefold enhancement in the photocurrent and photoluminescence response are observed on the oxidized GaN surfaces. These results are attributed to the surface passivation effects due to the deep ultraviolet-enhanced wet oxidation on GaN. (C) 2000 American Institute of Physics. [S0003-6951(00)00704-X].
引用
收藏
页码:511 / 513
页数:3
相关论文
共 50 条
  • [31] A review of in situ surface functionalization of gallium nitride via beaker wet chemistry
    Pearce, Brady L.
    Wilkins, Stewart J.
    Paskova, Tania
    Ivanisevic, Albena
    JOURNAL OF MATERIALS RESEARCH, 2015, 30 (19) : 2859 - 2870
  • [32] Room-temperature photoenhanced wet etching of GaN
    Minsky, MS
    White, M
    Hu, EL
    APPLIED PHYSICS LETTERS, 1996, 68 (11) : 1531 - 1533
  • [33] Dopant-selective photoenhanced wet etching of GaN
    C. Youtsey
    G. Bulman
    I. Adesida
    Journal of Electronic Materials, 1998, 27 : 282 - 287
  • [34] Oxidation of nitride bonded silicon carbide in wet air atmosphere
    Gao, W
    Hendry, A
    Holling, G
    BRITISH CERAMIC TRANSACTIONS, 2002, 101 (06): : 231 - 236
  • [35] Dopant-selective photoenhanced wet etching of GaN
    Youtsey, C
    Bulman, G
    Adesida, I
    JOURNAL OF ELECTRONIC MATERIALS, 1998, 27 (04) : 282 - 287
  • [36] Gallium arsenide antireflection layer via direct wet thermal oxidation
    Li, J.
    Tian, Y.
    Hall, D. C.
    ELECTRONICS LETTERS, 2015, 51 (07) : 575 - 576
  • [37] Anisotropy and Mechanistic Elucidation of Wet-Chemical Gallium Nitride Etching at the Atomic Level
    Tautz, Markus
    Weimar, Andreas
    Grassl, Christian
    Welzel, Martin
    Diaz Diaz, David
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2020, 217 (21):
  • [38] Side Wall Wet Etching Improves the Efficiency of Gallium Nitride Light Emitting Diodes
    Lin, Ray-Ming
    Li, Jen-Chih
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2012, 159 (04) : H433 - H439
  • [39] Brillouin scattering studies of gallium nitride and Indium gallium nitride
    Wu, Tsung Han
    Feng, Zhe Chuan
    Li, Fangfei
    Lin, Chung Cherng
    Ferguson, Ian
    Horng, Ray Hua
    Lu, Weijie
    XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY, 2010, 1267 : 1141 - +
  • [40] Photoenhanced wet chemical etching of n+-doped GaN
    Skriniarová, J
    van der Hart, A
    Bochem, HP
    Fox, A
    Kordos, P
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2002, 91 : 298 - 302