On the Theory of X-ray Diffraction Interferometry in Single Crystals. Peculiarities of Effect and Possibilities of Application

被引:3
|
作者
Kohn, V. G. [1 ]
Smirnova, I. A. [2 ]
机构
[1] Kurchatov Inst, Natl Res Ctr, Moscow 123182, Russia
[2] Russian Acad Sci, Inst Solid State Phys, Chernogolovka 142432, Moscow Oblast, Russia
基金
俄罗斯基础研究基金会;
关键词
PENDELLOSUNG FRINGES;
D O I
10.1134/S1063774522070446
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
A new version of X-ray diffraction interferometer in a single crystal is studied theoretically. This device is similar to the Young interferometer with two slits, but, instead of slits, it is proposed to use a bilens interferometer based on compound refractive lenses, which have already been created and are used in practice. The crystal makes it possible to reduce radically the interferometer sizes and provides additional possibilities for increasing the measurement accuracy. The features and structure of interference fringes, as well as the possibilities of practical use of the new-type interferometer are analyzed. Numerical calculations were performed using a universal computer program, which is being developed to solve a wide range of problems in X-ray optics.
引用
收藏
页码:1068 / 1074
页数:7
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