Reconstruction of the {111} face on a tungsten tip observed by means of a scanning field emission microscope (SFEM)

被引：3
|
作者：
Barwinski, B
Sendecki, S
机构：
[1] Institute of Experimental Physics, University of Wroclaw, 50 204 Wrocław
来源：
APPLIED SURFACE SCIENCE | 1997年 / 119卷 / 1-2期
关键词：
field emission; scanning microscopy;
D O I：
10.1016/S0169-4332(97)00172-4
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The paper describes a simple procedure of a preparation of tungsten tip for an application to ultra high vacuum scanning tunnelling microscope (UHV STM). Scanning field emission microscope was used as a testing method. A microtip with one atom on its apex was obtained by a reconstruction of the {111} face. The reconstruction is caused by annealing in the presence of a high electric field as well as by annealing without the field. (C) 1997 Elsevier Science B.V.
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页码：111 / 116
页数：6
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