Ultra-Thin Defect Tolerant High Efficiency III-V Tandems for Development of Low-Cost Photovoltaics

被引:0
|
作者
Freundlich, Alex [1 ]
Mehrotra, Akhil [1 ]
Gunasekera, Manori [1 ]
Lancel, Gilles [1 ]
Vijaya, Gopi Krishna [1 ]
机构
[1] Univ Houston, Ctr Adv Mat, Photovolta & Nanostruct Labs, Houston, TX 77204 USA
关键词
Thin Film; III-V Tandem; dislocation; Modeling; SOLAR-CELLS;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Here we theoretically and experimentally demonstrate that through a careful design optimization, and despite very high dislocation densities (>10(8) cm(-2)), ultra-thin (similar to 1 micron) dual junction solar cells with practical efficiencies in excess of 23% could be achieved. The study has also attempted to avoid the use of conventional indium-bearing III-V alloys and has focused on III-V semiconductor alloys made with more earth-abundant elements (i.e. AI, Sb, N ...). We have evaluated as a function of dislocation densities, the design parameters for devices that comprise a 1.7 eV top AlGaAs solar cell and a 1.25 eV bottom GaAsSb/GaAs(N) Sb cells. The experimental validation of modeling data was undertaken by the fabrication of proposed thin film subcells on intentionally dislocated buffers. As shown here, and in-line with our modeling results, even for defect densities in excess of 10(8) cm(-2), we were able to fabricate sets of top and bottom cells with combined open circuits voltages in excess of 1.7 volts. A direct extrapolation of these preliminary experimental results already indicate the potential for fabricating thin-film III-V devices on metal foils with 1 sun efficiencies in excess of 20%.
引用
收藏
页码:2117 / 2121
页数:5
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