Self-repairing adder using fault localization

被引:27
|
作者
Akbar, Muhammad Ali [1 ]
Lee, Jeong-A [1 ]
机构
[1] Chosun Univ, Dept Comp Engn, Comp Syst Lab, Kwangju, South Korea
关键词
Self-checking adder; Carry-select adder; Fault localization; Self-repairing adder; Multiple faults; ERROR-DETECTION; LOW-COST; DESIGN; VLSI;
D O I
10.1016/j.microrel.2014.02.033
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we propose an area-efficient self-repairing adder that can repair multiple faults and identify the particular faulty full adder. Fault detection and recovery has been carried out using self-checking full adders that can diagnose the fault based on internal functionality, independent of a fault propagated through carry. The idea was motivated by the common design problem of fault propagation due to carry in various approaches by self-checking adders. Such a fault can create problems in detecting the particular faulty full adder, and we need to replace the entire adder when an error is detected. We apply our self-checking full adder to a carry-select adder (CSeA) and show that the resulting self-checking CSeA consumes 15% less area compared to the previously proposed self-checking CSeA approach without fault localization. After observing fault localization with reduced area overhead, we utilize the self-checking full adder in constructing a self-repairing adder. It has been observed that our proposed self-repairing 16-bit adder can handle up to four faults effectively, with an 80% probability of error recovery compared to triple modular redundancy, which can handle only a single fault at a time. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1443 / 1451
页数:9
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