Structure dependent ultrafast relaxation time of photo-excited carriers in SiC

被引:9
|
作者
Tomita, T
Saito, S
Suemoto, T
Harima, H
Nakashima, S
机构
[1] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan
[2] Kyoto Inst Technol, Fac Engn & Design, Sakyo Ku, Kyoto 6068585, Japan
[3] Natl Inst Adv Ind Sci & Technol, FED, Adv Power Device Labs, Tsukuba, Ibaraki 3058568, Japan
关键词
silicon carbide; polytype; electron phonon scattering; transient absorption;
D O I
10.1143/JPSJ.73.2554
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The ultrafast inter-conduction band carrier dynamics in 6H-SiC and 4H-SiC was observed by using the pump and probe transient absorption technique. The observed decay times of transmission changes are 1.25 ps for 6H-SiC and 630 fs for 4H-SiC, respectively. Dependence of the transmission change on probe wavelength and polarization were analyzed by using the steady-state absorption profiles. From this analysis, the transmission change was ascribed to the decrease of electron population in the lowest conduction band. The experimental results show that the decay of the transmission change was dominated by the inter-band electron phonon scattering. The inter-band deformation potential in 4H-SiC, deduced from the observed decay time, was 1.25 times larger than that in 6H-SiC. This polytype dependence of inter-band deformation potential is discussed in terms of the hexagonality and band-gap energies.
引用
收藏
页码:2554 / 2561
页数:8
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