Accurate modelling of lossy SIW resonators using a neural network residual kriging approach

被引：4
|
作者：
Angiulli, Giovanni [1 ]
De Carlo, Domenico [2 ]
Sgro, Annalisa [2 ]
Versaci, Mario [2 ]
Morabito, Francesco Carlo [2 ]
机构：
[1] Univ Mediterranea, DIIES, Via Graziella Loc Feo di Vito, I-89122 Reggio Di Calabria, Italy
[2] Univ Mediterranea, DICEAM, Via Graziella Loc Feo di Vito, I-89122 Reggio Di Calabria, Italy
来源：
IEICE ELECTRONICS EXPRESS | 2017年 / 14卷 / 06期
关键词：
CAD; artificial neural networks; kriging; lossy SIW resonators; COMPUTATION;
D O I：
10.1587/elex.14.20170073
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, a computational intelligence method to model lossy substrate integrated waveguide (SIW) cavity resonators, the Neural Network Residual Kriging (NNRK) approach, is presented. Numerical results for the fundamental resonant frequency f(r) and related quality factor Q(r) computed for the case of lossy hexagonal SIW resonators demonstrate the NNRK superior estimation accuracy compared to that provided by the conventional Artificial Neural Networks (ANNs) models for these devices.
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页数：6
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