An analytical approach for assessment of voltage sags

被引：30

作者：

Goswami, Arup Kumar ^{[1
]}

Gupta, Chandra Prakash ^{[1
]}

Singh, Girish Kumar ^{[1
]}

机构：

[1] Indian Inst Technol, Dept Elect Engn, Roorkee 247667, Uttar Pradesh, India

来源：

INTERNATIONAL JOURNAL OF ELECTRICAL POWER & ENERGY SYSTEMS | 2009年 / 31卷 / 7-8期

关键词：

Method of critical distance; Fault distribution; Sequence impedances; Voltage sags; PROBABILISTIC ASSESSMENT; STOCHASTIC PREDICTION; FINANCIAL LOSSES; INTERRUPTIONS; SYSTEMS;

D O I：

10.1016/j.ijepes.2009.03.028

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, analytical expressions for the calculation of remaining voltages due to fault at bus and along the line are derived. Balanced and unbalanced faults are considered and the effects of different fault distributions are taken into account. The proposed analytical methods are compared with the method of critical distance in order to achieve the acceptability of the proposed method. The developed method is applied to the IEEE 30-bus test system and a real Indian distribution system. (C) 2009 Elsevier Ltd. All rights reserved,

引用

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页码：418 / 426

页数：9

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