Online Periodic Test of Reconfigurable Scan Networks

被引:0
|
作者
Lylina, Natalia [1 ]
Wang, Chih-Hao [1 ]
Wunderlich, Hans-Joachim [1 ]
机构
[1] Univ Stuttgart, ITI, Pfaffenwaldring 47, D-70569 Stuttgart, Germany
关键词
Reconfigurable Scan Networks; design-for-test; online test; periodic test; test generation;
D O I
10.1109/ATS56056.2022.00026
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Reconfigurable Scan Networks (RSNs) access embedded instruments throughout the whole system lifecycle. To support dependability management by means of RSNs, RSNs themselves must be continuously tested. The paper-at-hand presents the first online periodic test method for RSNs. The developed algorithm generates a short sequence of test patterns, which tests all parts of an RSN. The generated sequence is uploaded on-chip and is applied periodically to avoid fault accumulation in RSNs. The overall test application time is minimized to comply with the timing requirements of the well-known safety standards. The experimental results show that the method is efficient for all considered RSN designs and is scalable with the increasing size and complexity of RSNs.
引用
收藏
页码:78 / 83
页数:6
相关论文
共 50 条
  • [31] Reconfigurable scan architecture for test power and data volume reduction
    Oh, Hyunggoy
    Kim, Heetae
    Lim, Jaeil
    Kang, Sungho
    IEICE ELECTRONICS EXPRESS, 2017, 14 (13):
  • [32] Reconfigurable Scan Networks: Modeling, Verification, and Optimal Pattern Generation
    Baranowski, Rafal
    Kochte, Michael A.
    Wunderlich, Hans-Joachim
    ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2015, 20 (02)
  • [33] SCAR: Security Compliance Analysis and Resynthesis of Reconfigurable Scan Networks
    Lylina, Natalia
    Wang, Chih-Hao
    Wunderlich, Hans-Joachim
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 41 (12) : 5644 - 5656
  • [34] Fine-Grained Access Management in Reconfigurable Scan Networks
    Baranowski, Rafal
    Kochte, Michael A.
    Wunderlich, Hans-Joachim
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2015, 34 (06) : 937 - 946
  • [35] Compressing test data for deterministic BIST using a reconfigurable scan architecture
    Xiang, Dong
    Zhao, Yang
    Chakrabarty, Krishnendu
    Sun, Jiaguang
    Fujiwara, Hideo
    PROCEEDINGS OF THE 15TH ASIAN TEST SYMPOSIUM, 2006, : 299 - +
  • [36] Virtual Reconfigurable Scan-chains on FPGAs for Optimized Board Test
    Aleksejev, Igor
    Devadze, Sergei
    Jutman, Artur
    Shibin, Konstantin
    2015 16TH LATIN-AMERICAN TEST SYMPOSIUM (LATS), 2015,
  • [37] An EDF schedulability test for periodic tasks on reconfigurable hardware devices
    Danne, Klaus
    Platzner, Marco
    ACM SIGPLAN NOTICES, 2006, 41 (07) : 93 - 102
  • [38] Optimal segmented scan and simulation of reconfigurable architectures on fixed connection networks
    Bertossi, AA
    Mei, A
    HIGH PERFORMANCE COMPUTING - HIPC 2000, PROCEEDINGS, 2001, 1970 : 51 - 60
  • [39] Post-Silicon Validation of IEEE 1687 Reconfigurable Scan Networks
    Damljanovic, Aleksa
    Jutman, Artur
    Squillero, Giovanni
    Tsertov, Anton
    2019 IEEE EUROPEAN TEST SYMPOSIUM (ETS), 2019,
  • [40] A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks
    Cantoro, Riccardo
    Damljanovic, Aleksa
    Reorda, Matteo Sonza
    Squillero, Giovanni
    IEEE TRANSACTIONS ON COMPUTERS, 2020, 69 (01) : 87 - 98