Molecular dynamics computer simulations of 5 keV C60 bombardment of benzene crystal

被引：8

作者：

Czerwinski, Bartlomiej ^{[1
]}

Rzeznik, Lukasz ^{[1
]}

Paruch, Robert ^{[1
]}

Garrison, Barbara J. ^{[2
]}

Postawa, Zbigniew ^{[1
]}

机构：

[1] Jagiellonian Univ, Smoluchowski Inst Phys, PL-30059 Krakow, Poland

[2] Penn State Univ, Dept Chem, University Pk, PA 16802 USA

来源：

VACUUM | 2009年 / 83卷

基金：

美国国家科学基金会;

关键词：

Sputtering; SIMS/SNMS; Depth profiling; Cluster projectiles; Organic material; Molecular dynamics computer simulations; GA; AG(111);

D O I：

10.1016/j.vacuum.2009.01.034

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Coarse-grained molecular dynamics computer simulations have been used to investigate the damage of a benzene crystal induced by 5 keV C-60 projectile bombardment. The sputtering yield, mass distributions and the depth distributions of ejected organic molecules are analyzed. The temporal evolution of the system reveals that impinging C60 cluster leads to creation of almost hemispherical crater. Most of the molecules damaged by the projectile impact are ejected into the vacuum during cluster irradiation. This "cleaning up" effect may explain why secondary ion mass spectrometry (SIMS) analysis of some organic samples with cluster projectiles can produce significantly less accumulated damage compared to analysis performed with atomic ion beams. (C) 2009 Elsevier Ltd. All rights reserved.

引用

页码：S95 / S98

页数：4

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