Refinement of the crystal structures of the La3Ta0.5Ga5.5O14 and La3Nb0.5Ga5.5O14 compounds

被引:27
|
作者
Dudka, A. P. [1 ]
Mill, B. V. [2 ]
Pisarevsky, Yu. V. [1 ]
机构
[1] Russian Acad Sci, AV Shubnikov Crystallog Inst, Moscow 119333, Russia
[2] Moscow MV Lomonosov State Univ, Moscow 119992, Russia
基金
俄罗斯基础研究基金会;
关键词
DIFFRACTION DATA; REDUCED DATA; NEUTRON-DIFFRACTION; MINIMIZATION METHOD; ELECTRON-DENSITY; LANGASITE FAMILY; X-RAY; ABSORPTION; PARAMETERS; UREA;
D O I
10.1134/S106377450904004X
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
This paper reports on the results of accurate X-ray structural investigations of single crystals La3Ta0.5Ga5.5O14 (a = 8.2260(1) , c = 5.1207(1) , R/R (w) = 1.09%/1.10%, 3868 unique reflections) and La3Nb0.5Ga5.5O14 (a = 8.2237(1) , c = 5.1247(1) , R/R (w) = 1.02%/1.03%, 3735 unique reflections) (space group P321, Z = 1, sinI/lambda vertical bar(max) a parts per thousand 1.34 (-1) for both compounds). Using sets of data with a large number of high-angle reflections makes it possible to reliably compare the crystal structures by applying statistical tests. The structural differences between the La3Ta0.5Ga5.5O14 and La3Nb0.5Ga5.5O14 crystals are weakly pronounced, which correlates with the closeness of their piezoelectric characteristics.
引用
收藏
页码:558 / 567
页数:10
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