Superconductivity of lanthanum silicide thin films

被引：7
|
作者：
Travlos, A
Salamouras, N
机构：
[1] Natl Cent for Scientific Research, Athens, Greece
来源：
VACUUM | 1997年 / 48卷 / 01期
关键词：
D O I：
10.1016/S0042-207X(96)00236-9
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thin films of LaSi2-x, prepared by solid phase reaction of La with Si substrates in vacuum, have been studied using X-ray diffraction and electron microscopy. Their electrical resistivity was measured as a function of temperature from 1.6 to 300 K. The LaSi2-x layers were found to be metallic with a superconductive transition at 2-5 K. Copyright (C) 1996 Elsevier Science Ltd.
引用
收藏
页码：13 / 14
页数：2
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