Probability of integrated circuits failures on influence of pulsed radio-wave radiation

被引：0
|
作者：
Solodov, A. V. [1 ]
机构：
[1] RAS, Moscow Radiotech Inst, Moscow 117519, Russia
来源：
2006 16th International Crimean Conference Microwave & Telecommunication Technology, Vols 1 and 2, Conference Proceedings | 2006年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A theoretical development of the damages accumulation model is presented. The probability and energy of IC damage is determined as a function of number of electromagnetic pulses N.
引用
收藏
页码：719 / 720
页数：2
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