First demonstration of field-free perpendicular SOT-MRAM for ultrafast and high-density embedded memories

被引:28
|
作者
Cai, K. [1 ]
Talmelli, G. [1 ]
Fan, K. [1 ,2 ]
Van Beek, S. [1 ]
Kateel, V. [1 ,2 ]
Gupta, M. [1 ]
Monteiro, M. G. [1 ]
Ben Chroud, M. [1 ,3 ]
Jayakumar, G. [1 ]
Trovato, A. [1 ]
Rao, S. [1 ]
Kar, G. S. [1 ]
Couet, S. [1 ]
机构
[1] Imec, Kapeldreef 75, B-3001 Leuven, Belgium
[2] Katholieke Univ Leuven, ESAT, B-3001 Leuven, Belgium
[3] Katholieke Univ Leuven, Dept Phys & Astron, B-3001 Leuven, Belgium
关键词
D O I
10.1109/IEDM45625.2022.10019360
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
For the first time, we experimentally demonstrate the field-free switching in multi-pillar (MP) spin-orbit torque magnetic random-access memory (SOT-MRAM) devices, which are CMOS-compatible 300mm integrated perpendicular MTJs (p-MTJs). The field-free switching (FFS) is achieved by integrating an additional in-plane (IP) magnet layer below the conventional heavy metal layer, forming a hybrid spin source layer. The in-plane magnet contributes to additional unconventional spin-orbit torque, breaking the symmetry for field-free switching and leading to high SOT switching efficiency. We demonstrate ultrafast field-free switching with current pulses down to 0.3 ns, corresponding to a power consumption of 60 fJ/bit. Moreover, this FFS scheme is fully compatible with the standard integration process and the voltage-gated SOT (VG-SOT) switching in MP devices. Selective operations of independent write and read between multiple MTJs on a shared SOT track can also be achieved without external magnetic field. The FFS concept is scalable, agnostic to SOT material, and enables the reduction of the external periphery (i.e.: transistors). Thus, our proposed concept is advantageous for further improving the density and energy efficiency of SOT-MRAM technology.
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页数:4
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