Measuring timing jitter with optical cross correlations

被引：51

作者：

Jiang, LA ^{[1
]}

Wong, ST ^{[1
]}

Grein, ME ^{[1
]}

Ippen, EP ^{[1
]}

Haus, HA ^{[1
]}

机构：

[1] MIT, Dept Elect Engn & Comp Sci, Elect Res Lab, Cambridge, MA 02139 USA

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 2002年 / 38卷 / 08期

基金：

美国国家科学基金会;

关键词：

actively mode-locked laser diode; cross correlation; fluctuations; monolithic passively mode-locked laser diode; noise measurements; probability density function; pulse-to-pulse jitter; timing jitter; variance;

D O I：

10.1109/JQE.2002.800993

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The use of optical cross correlations for characterizing timing jitter is investigated. Applications, limitations, and correspondence to radio frequency measurements are presented and clarified. The probability density function of the timing jitter of semiconductor mode-locked lasers is deconvolved from the cross-correlation measurements with the aid of pulse characterization techniques.

引用

页码：1047 / 1052

页数：6

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