Depth Profiling of Complex Samples Using Confocal Raman Microscopy

被引：0
|
作者：
Tague, Thomas J., Jr. [1 ]
机构：
[1] Bruker Opt Inc, Billerica, MA 01821 USA
来源：
SPECTROSCOPY | 2013年
关键词：
D O I：
暂无
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：16 / 17
页数：2
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