The interpretation of tapping mode images of polymer surfaces in Atomic Force Microscopy.

被引：0
|
作者：
Llewellyn, JP [1 ]
Sayers, P [1 ]
机构：
[1] Univ Wales, SEECS, Bangor LL57 1UT, Gwynedd, Wales
来源：
ELECTROSTATICS 1999 | 1999年 / 163卷
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The differential equation describing the motion of a vibrating AFM cantilever used in the tapping mode is solved numerically to find the phase of the vibrations. The effects of introducing a Coulomb interaction between the cantilever tip and the surface, and also an energy loss during the tapping process, are investigated.
引用
收藏
页码：403 / 406
页数：4
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