Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

被引：24
|
作者：
Snigirev, OV
Andreev, KE
Tishin, AM
Gudoshnikov, SA
Bohr, J
机构：
[1] RUSSIAN ACAD SCI,INST TERR MAGNETISM IONOSPHERE & RADIO WAVE P,TROITSK 142092,RUSSIA
[2] TECH UNIV DENMARK,DEPT PHYS,DK-2800 LYNGBY,DENMARK
来源：
PHYSICAL REVIEW B | 1997年 / 55卷 / 21期
关键词：
D O I：
10.1103/PhysRevB.55.14429
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have applied a scanning HTS (high-temperature superconductor) de SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Angstrom at T = 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Angstrom. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Angstrom.
引用
收藏
页码：14429 / 14433
页数：5
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