Full-field deformation measurements during seismic loading of masonry buildings

被引:20
|
作者
Rajaram, S. [1 ]
Vanniamparambil, P. A. [1 ]
Khan, F. [2 ]
Bolhassani, M. [2 ]
Koutras, A. [3 ]
Bartoli, I. [2 ]
Moon, F. [2 ]
Hamid, A. [2 ]
Shing, P. Benson [3 ]
Tyson, J. [4 ]
Kontsos, A. [1 ]
机构
[1] Drexel Univ, Dept Mech Engn & Mech, Philadelphia, PA 19104 USA
[2] Drexel Univ, Dept Civil Architectural & Environm Engn, Philadelphia, PA 19104 USA
[3] Univ Calif San Diego, Dept Struct Engn, La Jolla, CA 92093 USA
[4] Tril Qual Syst, Plymouth Meeting, PA 19462 USA
来源
基金
美国国家科学基金会;
关键词
digital image correlation; structural health monitoring; concrete masonry walls; shake table; damage; DIGITAL-IMAGE-CORRELATION; SCANNING-ELECTRON-MICROSCOPY; QUANTITATIVE SMALL; VOLUME CORRELATION; BALLISTIC IMPACT; SURFACE; MAGNIFICATIONS; NDT;
D O I
10.1002/stc.1903
中图分类号
TU [建筑科学];
学科分类号
0813 ;
摘要
This article demonstrates the potential of the digital image correlation (DIC) method to provide accurate full-field deformation measurements and successfully monitor the development of damage during seismic excitation of a partially grouted reinforced masonry building. The building was subjected to a sequence of earthquake ground motion records using the Large High Performance Outdoor Shake Table at the University of California, San Diego. The DIC setup was capable of measuring surface deformations of the single-story building with high frame rate cameras located at a distance greater than 50ft away. The accuracy of the measurements was assessed with data obtained using mounted displacement transducers. The full-field deformation data collected by the DIC system was capable to detect strain localization patterns associated with the onset of wall cracking before it could be shown by the displacement sensor data or by post mortem visual inspection. The research findings reported herein demonstrate, for the first time to the authors' best knowledge, the potential of in situ monitoring of actual structures for damage induced by non-stationary loading profiles using optical metrology. Copyright (c) 2016 John Wiley & Sons, Ltd.
引用
收藏
页数:14
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