SOC Test Optimization with Compression-Technique Selection

被引：0

作者：

Larsson, Anders ^{[1
]}

Zhang, Xin ^{[1
]}

Larsson, Erik ^{[1
]}

Chakrabarty, Krishnendu ^{[2
]}

机构：

[1] Linkoping Univ, Dept Comp Sci, SE-58283 Linkoping, Sweden

[2] Duke Univ, Dept Elect & Comp Engn, Durham, NC 27708 USA

来源：

2008 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2, PROCEEDINGS | 2008年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The increasing test-data volumes needed for the testing of system-on-chip (SOC) lead to long test times and high memory requirements. We present an analysis to highlight the fact that the impact of a test-data compression technique on test time and compression ratio are method-dependant as well as TAM-width dependant. Therefore, we propose a technique where compression-tachnique selection is integrated with core wrapper design, test architecture design, and test scheduling to minimize the SOC test time and the test-data volume.

引用

页码：1041 / 1041

页数：1

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