REGARDING THE CHARACTERIZATION ANALYSIS OF SILICONE RUBBER RECOVERABLE FROM COMPOSITE ELECTRICAL INSULATORS

被引：0
|
作者：
Daniel, Popescu [1 ]
Mirela, Cherciu [1 ]
机构：
[1] Univ Craiova, Mech Fac, Craiova, Romania
来源：
PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON MANUFACTURING SCIENCE AND EDUCATION (MSE 2011), VOL I | 2011年
关键词：
silicone rubber; recovery; microscopy; SEM; AFM;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The paper presents some techniques and methods for analyzing surface topography and microstructure investigation of silicone rubber, obtained by recovery of materials from electric insulators. AFM and SEM photomicrography are presented with structural maps of material surfaces and roughness characteristics, microstructures in various representative sections made at different depths of penetration and different scale optical zoom. Characteristics of silicone rubber obtained from the recovery are also presented.
引用
收藏
页码：75 / 78
页数：4
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