Built-in self-testing based on compressed 2-dimensional signature analysis

被引：2
|
作者：
Cai, CX [1 ]
Wang, XT [1 ]
Peng, YN [1 ]
机构：
[1] Tsinghua Univ, Dept Elect Engn, Beijing 100084, Peoples R China
来源：
2001 CIE INTERNATIONAL CONFERENCE ON RADAR PROCEEDINGS | 2001年
关键词：
built-in self-testing; signature analysis; faulty coverage ratio;
D O I：
10.1109/ICR.2001.984853
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The designing process of modem electronic systems demands high system reliability and maintainability. In order to perform fault detection, localization and isolation effectively, it is necessary to design a Built-In Self-Testing (BIST) module specific for the corresponding system. This paper presents a BIST method based on the compressed 2-dimensional signature analysis. The principle of compression and performance of test are discussed in detail. Using the presented method, a high Faulty Coverage Ratio (FCR) can be achieved with a short signature compressed in both time domain and space domain. Theoretical analysis shows that this method is reliable and it can be easily implemented in hardware.
引用
收藏
页码：885 / 888
页数：4
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