Evaluation of complementary metal-oxide semiconductor based photodetectors for low-level light detection

被引:8
|
作者
Ardeshirpour, Yasaman [1 ]
Deen, M. Jamal [1 ]
Shirani, Shahram [1 ]
机构
[1] McMaster Univ, Dept Elect & Comp Engn, Hamilton, ON L9H 6J5, Canada
来源
基金
加拿大自然科学与工程研究理事会;
关键词
D O I
10.1116/1.2190652
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Current low-level light detection technologies for biomedical applications such as DNA microarray sensors use charge-coupled devices or photomultiplier tubes which cannot be easily integrated with electronic circuits on a chip. Complementary metal-oxide semiconductor (CMOS) image sensors do allow for the integration of photosensitive and signal processing elements on the same chip. However, more research is required if optimized low-level light detectors in standard CMOS technologies are to be developed. In this research, we have investigated different photosensitive devices, including vertical, lateral, and avalanche photodiodes and two floating gate-well-tied phototransistors with different gate oxide thicknesses. The photodetectors were fabricated in a commercial 0.18 mu m CMOS technology, and their optoelectronic characteristics were measured to determine the optimum configuration for low-level light detection. (c) 2006 American Vacuum Society.
引用
收藏
页码:860 / 865
页数:6
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