Large-Velocity Saturation in Thin-Film Black Phosphorus Transistors

被引:44
|
作者
Chen, Xiaolong [1 ]
Chen, Chen [1 ]
Levi, Adi [2 ,3 ]
Houben, Lothar [4 ]
Deng, Bingchen [1 ]
Yuan, Shaofan [1 ]
Ma, Chao [1 ]
Watanabe, Kenji [5 ]
Taniguchi, Takashi [5 ]
Naveh, Doron [2 ,3 ]
Du, Xu [6 ]
Xia, Fengnian [1 ]
机构
[1] Yale Univ, Dept Elect Engn, 15 Prospect St,Becton 519, New Haven, CT 06511 USA
[2] Bar Ilan Univ, Fac Engn, IL-52900 Ramat Gan, Israel
[3] Bar Ilan Univ, Bar Ilan Inst Nanotechnol & Adv Mat, IL-52900 Ramat Gan, Israel
[4] Weizmann Inst Sci, Dept Chem Res Support, IL-76100 Rehovot, Israel
[5] Natl Inst Mat Sci, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan
[6] SUNY Stony Brook, Dept Phys & Astron, Stony Brook, NY 11794 USA
基金
以色列科学基金会;
关键词
black phosphorus; drift velocity; saturation velocity; electron-impurity scattering; electron-phonon scattering; field-effect transistors; FIELD-EFFECT TRANSISTORS; TRANSPORT; MOBILITY; CONTACT; GAS;
D O I
10.1021/acsnano.8b02295
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A high saturation velocity semiconductor is appealing for applications in electronics and optoelectronics. Thin-film black phosphorus (BP), an emerging layered semiconductor, shows a high carrier mobility and strong mid-infrared photoresponse at room temperature. Here, we report the observation of high intrinsic saturation velocity in 7 to 11 rim thick BP for both electrons and holes as a function of charge-carrier density, temperature, and crystalline direction. We distinguish a drift velocity transition point due to the competition between the electron-impurity and electron phonon scatterings. We further achieve a room-temperature saturation velocity of 1.2 (1.0) X 10(7) cm s(-1) for hole (electron) carriers at a critical electric field of 14 (13) kV cm(-1), indicating current-gain cutoff frequency similar to 20 GHz center dot mu m for radio frequency applications. Moreover, the current density is as high as 580 mu A mu m(-1) at a low electric field of 10 kV cm(-1). Our studies demonstrate that thin-film BP outperforms silicon in terms of saturation velocity and critical field, revealing its great potential in radio-frequency electronics, high-speed mid-infrared photodetectors, and optical modulators.
引用
收藏
页码:5003 / 5010
页数:8
相关论文
共 50 条
  • [41] ZNTE AND INSB THIN-FILM TRANSISTORS
    SPINULES.I
    ELECTRONICS LETTERS, 1967, 3 (06) : 268 - &
  • [42] EXTENSION OF THE THEORY OF THIN-FILM TRANSISTORS
    NEUMARK, GF
    SOLID-STATE ELECTRONICS, 1964, 7 (10) : 725 - 732
  • [43] IV CHARACTERISTICS OF THIN-FILM TRANSISTORS
    CHEN, I
    LUO, FC
    JOURNAL OF APPLIED PHYSICS, 1981, 52 (04) : 3020 - 3026
  • [44] Performance of organic thin-film transistors
    Marinov, O.
    Deen, M. Jamal
    Iniguez, B.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2006, 24 (04): : 1728 - 1733
  • [45] EVAPORATED SILICON THIN-FILM TRANSISTORS
    SALAMA, CAT
    YOUNG, L
    SOLID-STATE ELECTRONICS, 1967, 10 (05) : 473 - +
  • [46] Zinc oxide thin-film transistors
    Fortunato, E
    Barquinha, P
    Pimentel, A
    Gonçalves, A
    Marques, A
    Pereira, L
    Martins, R
    ZINC OXIDE - A MATERIAL FOR MICRO- AND OPTOELECTRONIC APPLICATIONS, 2005, 194 : 225 - 238
  • [47] From Cyclopentasilane to Thin-Film Transistors
    Gerwig, Maik
    Ali, Abid Shaukat
    Neubert, David
    Polster, Sebastian
    Boehme, Uwe
    Franze, Georg
    Rosenkranz, Marco
    Popov, Alexey
    Ponomarev, Ilia
    Jank, Michael P. M.
    Viehweger, Christine
    Brendler, Erica
    Frey, Lothar
    Kroll, Peter
    Kroke, Edwin
    ADVANCED ELECTRONIC MATERIALS, 2021, 7 (02)
  • [48] STUDIES OF CDS THIN-FILM TRANSISTORS
    KASHIWABA, Y
    MIYASHIT.K
    SEKI, T
    WADA, M
    ELECTRONICS & COMMUNICATIONS IN JAPAN, 1969, 52 (02): : 157 - +
  • [49] Metal contacts in thin-film transistors
    Stallinga, P.
    Gomes, H. L.
    ORGANIC ELECTRONICS, 2007, 8 (04) : 300 - 304
  • [50] Electrical modeling of thin-film transistors
    Hong, D.
    Yerubandi, G.
    Chiang, H. Q.
    Spiegelberg, M. C.
    Wager, J. F.
    CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 2008, 33 (02) : 101 - 132