Combined complex ridgelet shrinkage and total variation minimization

被引:21
|
作者
Ma, Jianwei
Fenn, Markus
机构
[1] Univ Oxford, Inst Math, Oxford Ctr Ind & Appl Math, Oxford OX1 3LB, England
[2] Univ Mannheim, Dept Math & Comp Sci, D-68131 Mannheim, Germany
来源
SIAM JOURNAL ON SCIENTIFIC COMPUTING | 2006年 / 28卷 / 03期
关键词
nonequispaced fast Fourier transform; ridgelets; complex wavelets; shift invariance; total variation minimization; detection of line singularities; surface characterization;
D O I
10.1137/05062737X
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
A new algorithm for the characterization of engineering surface topographies with line singularities is proposed. It is based on thresholding complex ridgelet coefficients combined with total variation (TV) minimization. The discrete ridgelet transform is designed by first using a discrete Radon transform based on the nonequispaced fast Fourier transform (NFFT) and then applying a dual-tree complex wavelet transform (DT CWT). The NFFT-based approach of the Radon transform completely avoids linear interpolations of the Cartesian-to-polar grid and requires only O(n(2) log n) arithmetic operations for n by n arrays, while its inverse preserves the good reconstruction quality of the filtered backprojection. The DT CWT in the second step of the ridgelet transform provides approximate shift invariance on the projections of the Radon transform. After hard thresholding the ridgelet coefficients, they are restored using TV minimization to eliminate the pseudo-Gibbs artifacts near the discontinuities. Numerical experiments demonstrate the remarkable ability of the methodology to extract line scratches.
引用
收藏
页码:984 / 1000
页数:17
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