Image Colorization Using the Global Scene-Context Style and Pixel-Wise Semantic Segmentation

被引:6
|
作者
Tram-Tran Nguyen-Quynh [1 ]
Kim, Soo-Hyung [1 ]
Nhu-Tai Do [1 ]
机构
[1] Chonnam Natl Univ, Dept Artificial Intelligence Convergence, Gwangju 61186, South Korea
基金
新加坡国家研究基金会;
关键词
Image color analysis; Semantics; Image segmentation; Computer architecture; Gray-scale; Task analysis; Encoding; Image colorization; soft-encoding; u-net; scene-context classification; semantic segmentation; COLOR;
D O I
10.1109/ACCESS.2020.3040737
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we present an encoder-decoder architecture that exploits global and local semantics for the automatic image colorization problem. For the global semantics, the low-level encoding features are fine-tuned by the scene-context classification to integrate the global image style. Moreover, the architecture deals with the uncertainty and relations among the scene styles based on the label smoothing and pre-trained weights from Places365. For local semantics, three branches learn the mutual benefits at the pixel-level, in which average and multi-modal distributions are respectively created from regression and soft-encoding branches, while the segmentation branch determines to which object the pixel belongs. Our experiments, which involve training with the Coco-Stuff dataset and validation on DIV2K, Places365, and ImageNet, show that our results are very encouraging.
引用
收藏
页码:214098 / 214114
页数:17
相关论文
共 50 条
  • [31] A Dead-time Free Global Shutter CMOS Image Sensor with in-pixel LOFIC and ADC using Pixel-wise Connections
    Sugo, Hidetake
    Wakashima, Shunichi
    Kuroda, Rihito
    Yamashita, Yuichiro
    Sumi, Hirofumi
    Wang, Tzu-Jui
    Chou, Po-Sheng
    Hsu, Ming-Chieh
    Sugawa, Shigetoshi
    2016 IEEE SYMPOSIUM ON VLSI CIRCUITS (VLSI-CIRCUITS), 2016,
  • [32] A new image decomposition approach using pixel-wise analysis sparsity model
    Du, Shuangli
    Liu, Yiguang
    Zhao, Minghua
    Xu, Zhenyu
    Li, Jie
    You, Zhenzhen
    PATTERN RECOGNITION, 2023, 136
  • [33] Accurate Pixel-Wise Skin Segmentation Using Shallow Fully Convolutional Neural Network
    Minhas, Komal
    Khan, Tariq M.
    Arsalan, Muhammad
    Naqvi, Syed Saud
    Ahmed, Mansoor
    Khan, Haroon Ahmed
    Haider, Muhammad Adnan
    Haseeb, Abdul
    IEEE ACCESS, 2020, 8 (08): : 156314 - 156327
  • [34] Comparative analysis between a pixel-wise image encryption scheme and AES in a web application context
    Mokhnache, Abdelaziz
    Ziet, Lahcene
    Radjah, Faycal
    CLUSTER COMPUTING-THE JOURNAL OF NETWORKS SOFTWARE TOOLS AND APPLICATIONS, 2024, 27 (03): : 2971 - 2982
  • [35] Semantic Segmentation Using Pixel-Wise Adaptive Label Smoothing via Self-Knowledge Distillation for Limited Labeling Data
    Park, Sangyong
    Kim, Jaeseon
    Heo, Yong Seok
    SENSORS, 2022, 22 (07)
  • [36] Civil infrastructure defect assessment using pixel-wise segmentation based on deep learning
    Savino, Pierclaudio
    Tondolo, Francesco
    JOURNAL OF CIVIL STRUCTURAL HEALTH MONITORING, 2023, 13 (01) : 35 - 48
  • [37] Civil infrastructure defect assessment using pixel-wise segmentation based on deep learning
    Pierclaudio Savino
    Francesco Tondolo
    Journal of Civil Structural Health Monitoring, 2023, 13 : 35 - 48
  • [38] Semantic Image Segmentation Using Scant Pixel Annotations
    Chakravarthy, Adithi D.
    Abeyrathna, Dilanga
    Subramaniam, Mahadevan
    Chundi, Parvathi
    Gadhamshetty, Venkataramana
    MACHINE LEARNING AND KNOWLEDGE EXTRACTION, 2022, 4 (03): : 621 - 640
  • [39] DipG-Seg: Fast and Accurate Double Image-Based Pixel-Wise Ground Segmentation
    Wen, Hao
    Liu, Senyi
    Liu, Yuxin
    Liu, Chunhua
    IEEE TRANSACTIONS ON INTELLIGENT TRANSPORTATION SYSTEMS, 2024, 25 (06) : 5189 - 5200
  • [40] A Pixel-Wise Segmentation Method for Automatic X-Ray Image Detection of Chip Packaging Defects
    Wang, Jie
    Li, Gaomin
    Zhou, Yuezheng
    Bai, Haoyu
    Li, Xuan
    Zhong, Lijun
    Zhang, Xiaohu
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2024, 14 (08): : 1520 - 1527