Evidence for dielectric aging due to progressive 180° domain wall pinning in polydomain Pb(Zr0.45Ti0.55)O3 thin films (vol 79, 054104, 2009)

被引：0
|
作者：
Mokry, Pavel
Wang, Yongli
Tagantsev, Alexander K.
Damjanovic, Dragan
Stolichnov, Igor
Setter, Nava
机构：
来源：
PHYSICAL REVIEW B | 2009年 / 79卷 / 21期
关键词：
ageing; dielectric thin films; electric domain walls; lead compounds;
D O I：
10.1103/PhysRevB.79.219903
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页数：1
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