Preparation, characterization and dielectric properties of Ba5LnZnTa9O30 (Ln = La, Sm) ceramics

被引:36
|
作者
Fang, L [1 ]
Zhang, H [1 ]
Yang, JF [1 ]
Yuan, RZ [1 ]
Liu, HX [1 ]
机构
[1] Wuhan Univ Technol, State Key Lab Adv Technol Mat Synth & Proc, Wuhan 430070, Peoples R China
基金
中国国家自然科学基金;
关键词
oxides; electronic materials; X-ray diffraction; dielectric properties;
D O I
10.1016/j.materresbull.2003.12.004
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ba(5)LnZnTa(9)O(30) (Ln = La, Sm) ceramics were prepared by high temperature solid-state reaction route. The samples were characterized by X-ray diffraction, scanning electron microscopy (SEM), and differential scanning calorimetry (DSC) methods. They belong to paraelectric phase of filled tetragonal TB structure at room temperature with unit cell a = 12.5909(4) Angstrom, c = 3.9622(2) Angstrom for Ba5LaZnTa9O30; and a = 12.5777(4) Angstrom, c = 3.9544(2) Angstrom for Ba5SmZnTa9O30. At 1 MHz, Ba5LaZnTa9O30 has high dielectric constants of 89 with low dielectric loss 0.0067, and temperature coefficients of the dielectric constant (tau(epsilon)) - 811 ppm degreesC(-1); Ba5LaZnTa9O30 has dielectric constants of 74 with low dielectric loss 0.0035, and tau(epsilon) -474 ppm degreesC(-1). (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:677 / 682
页数:6
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