Precise control of Jeff=1/2 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness

被引：7

作者：

Geprags, Stephan ^{[1
]}

Skovdal, Bjorn Erik ^{[2
,3
]}

Scheufele, Monika ^{[1
,4
]}

Opel, Matthias ^{[1
]}

Wermeille, Didier ^{[5
]}

Thompson, Paul ^{[5
]}

Bombardi, Alessandro ^{[6
]}

Simonet, Virginie ^{[7
]}

Grenier, Stephane ^{[7
]}

Lejay, Pascal ^{[7
]}

Chahine, Gilbert Andre ^{[8
]}

Quintero-Castro, Diana Lucia ^{[9
]}

Gross, Rudolf ^{[1
,4
,10
]}

Mannix, Danny ^{[7
,11
,12
]}

机构：

[1] Walther Meissner Inst Tieftemp Forsch, Bayer Akad Wissensch, D-85748 Garching, Germany

[2] Lund Univ, Div Synchrotron Radiat, SE-22100 Lund, Sweden

[3] Uppsala Univ, Angstrom Ctr, SE-75121 Uppsala, Sweden

[4] Tech Univ Munich, Phys Dept, D-85748 Garching, Germany

[5] European Synchrotron Radiat Facil, XMaS CRG Beamline, F-38043 Grenoble, France

[6] Diamond Light Source Ltd, Harwell Sci & Innovat Campus, Didcot OX11 0DE, Oxon, England

[7] Univ Grenoble Alpes, Inst Neel, Grenoble INP, CNRS, F-38000 Grenoble, France

[8] Univ Grenoble Alpes, SIMaP, Grenoble INP, CNRS, F-38000 Grenoble, France

[9] Univ Stavanger, Dept Math & Phys, N-4036 Stavanger, Norway

[10] Munich Ctr Quantum Sci & Technol MCQST, D-80799 Munich, Germany

[11] European Spallat Source, SE-22100 Lund, Sweden

[12] Aarhus Univ, Langelandsgade 140, DK-8000 Aarhus, Denmark

来源：

PHYSICAL REVIEW B | 2020年 / 102卷 / 21期

基金：

英国工程与自然科学研究理事会;

关键词：

Magnetic anisotropy - Rhodium compounds - Degrees of freedom (mechanics) - Epitaxial growth - Film thickness - Transition metal oxides - Transition metals - Magnetism - Strontium compounds - Thin films - X ray scattering;

D O I：

10.1103/PhysRevB.102.214402

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal J(eff) = 1/2 compound Sr2IrO4 by advanced x-ray scattering. We find that the Sr2IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2IrO4 and bring to light the potential for a rich playground to explore the physics of 5d transition-metal compounds.

引用

页数：13

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