Precise control of Jeff=1/2 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness

We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal J(eff) = 1/2 compound Sr2IrO4 by advanced x-ray scattering. We find that the Sr2IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2IrO4 and bring to light the potential for a rich playground to explore the physics of 5d transition-metal compounds.