Anomalous Lattice Shrink of a Single CeO2 Submicrometer Particle in an Optical Trap

被引：3

作者：

Fukuyama, Yoshimitsu ^{[1
]}

Yasuda, Nobuhiro ^{[1
]}

Kimura, Shigeru ^{[1
]}

Takata, Masaki ^{[1
,2
]}

机构：

[1] Japan Synchrotron Radiat Res Inst, SPring 8, Sayo, Hyogo 6795198, Japan

[2] RIKEN, SPring 8, Sayo, Hyogo 6795148, Japan

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 2013年 / 82卷 / 11期

关键词：

optical trap; X-ray diffraction; submicrometer particle; lattice shrink; RADIATION PRESSURE; LASER-BEAMS; NANOPARTICLES; MICRODIFFRACTION; RELAXATION; EXPANSION; SPRING-8; BL40XU; CERIA; PURE;

D O I：

10.7566/JPSJ.82.114608

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Anomalous lattice shrink is observed in a single submicrometer-sized CeO2 particle with X-ray diffraction using an optical-trap sample holder. A CeO2 particle 380 nm in size is successfully levitated with radiation pressure force exerted by counterpropagating laser beams and irradiated by a high-flux focused synchrotron radiation beam. The diffraction pattern of a single particle is consistent with that of CeO2 but the lattice shrink approaches 1.22% of the lattice constant of a particle assemblage.

引用

页数：4

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