Anomalous Lattice Shrink of a Single CeO2 Submicrometer Particle in an Optical Trap

被引:3
|
作者
Fukuyama, Yoshimitsu [1 ]
Yasuda, Nobuhiro [1 ]
Kimura, Shigeru [1 ]
Takata, Masaki [1 ,2 ]
机构
[1] Japan Synchrotron Radiat Res Inst, SPring 8, Sayo, Hyogo 6795198, Japan
[2] RIKEN, SPring 8, Sayo, Hyogo 6795148, Japan
关键词
optical trap; X-ray diffraction; submicrometer particle; lattice shrink; RADIATION PRESSURE; LASER-BEAMS; NANOPARTICLES; MICRODIFFRACTION; RELAXATION; EXPANSION; SPRING-8; BL40XU; CERIA; PURE;
D O I
10.7566/JPSJ.82.114608
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Anomalous lattice shrink is observed in a single submicrometer-sized CeO2 particle with X-ray diffraction using an optical-trap sample holder. A CeO2 particle 380 nm in size is successfully levitated with radiation pressure force exerted by counterpropagating laser beams and irradiated by a high-flux focused synchrotron radiation beam. The diffraction pattern of a single particle is consistent with that of CeO2 but the lattice shrink approaches 1.22% of the lattice constant of a particle assemblage.
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页数:4
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