Structural characterisation of polycrystalline α,ω-dihexyl quaterthiophene thin films by transmission electron microscopy

被引：6
|
作者：
Campione, M
Borghesi, A
Moret, M
Sassella, A
Lotz, B
Thierry, A
机构：
[1] INFM, Dipartimento Sci Mat, I-20125 Milan, Italy
[2] Univ Milan, I-20125 Milan, Italy
[3] Inst Charles Sadron, CNRS, F-67083 Strasbourg, France
来源：
ORGANIC ELECTRONICS | 2004年 / 5卷 / 1-3期
关键词：
organic molecular beam deposition; transmission electron microscopy; structural characterisation; thin film growth; oligothiophenes;
D O I：
10.1016/j.orgel.2004.01.003
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
alpha,omega-dihexyl quaterthiophene thin films have been deposited by ultra-high vacuum sublimation on silica and potassium hydrogen phthalate substrates. The influence of the substrate on the structure of the films are investigated by transmission electron microscopy and the results are compared with the morphological and optical properties of the same samples. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：141 / 145
页数：5
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