Application of the dual energy technique by using a photon counting CdTe detector

被引：0

作者：

Zou, Wenjuan ^{[1
]}

Nakashima, Takuya ^{[1
]}

Onishi, Yoshiaki ^{[1
]}

Morii, Hisashi ^{[1
]}

Neo, Yoichiro ^{[1
]}

Mimura, Hidenori ^{[1
]}

Aoki, Toru ^{[1
]}

机构：

[1] Shizuoka Univ, Elect Res Inst, Hamamatsu, Shizuoka 4328011, Japan

来源：

HARD X-RAY, GAMMA-RAY, AND NEUTRON DETECTOR PHYSICS X | 2008年 / 7079卷

关键词：

CdTe line detector; computed tomography; linear attenuation coefficient; atomic number; electron density;

D O I：

10.1117/12.794634

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have proposed a new system for X-ray computed tomography (CT) scanning. By employing the dual-energy measurement, the obtained data can be used to deduce distribution images of the atomic number and electron density which are useful for identifying the scanned material. In this work, two different methods were given for the derivative process. We found method A was suitable for measuring low-Z materials while method B worked well for high-Z materials. Therefore, the two derivative methods may work complementally for material identification.

引用

页数：12

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