An Evaluation of a New Type of High Efficiency Hybrid Gate Drive Circuit for SiC-MOSFET Suitable for Automotive Power Electronics System Applications

被引:0
|
作者
Yamamoto, Masayoshi [1 ]
Shirai, Shinya [2 ]
Thilak, Senanayake [1 ]
Imaoka, Jun [1 ]
Ishido, Ryosuke [3 ]
Okawauchi, Yuta [3 ]
Nakahara, Ken [3 ]
机构
[1] Nagoya Univ, Nagoya, Aichi 4648601, Japan
[2] Mitsubishi Heavy Ind Co Ltd, Kyoto 6158585, Japan
[3] ROHM Co Ltd, Nagoya, Aichi 4530855, Japan
关键词
SiC-MOSFET; gate-driver; current-source; voltage-source; gate resistance; CONDUCTION-MODE; DC; CONVERTER;
D O I
10.1587/transfun.2021GCI0001
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In response to fast charging systems, Silicon Carbide (SiC) power semiconductor devices are of great interest of the automotive power electronics applications as the next generation of fast charging systems require high voltage batteries. For high voltage battery EVs (Electric Vehicles) over 800V, SiC power semiconductor devices are suitable for 3-phase inverters, battery chargers, and isolated DC-DC converters due to their high voltage rating and high efficiency performance. However, SiC-MOSFETs have two characteristics that interfere with high-speed switching and high efficiency performance operations for SiC MOS-FET applications in automotive power electronics systems. One characteristic is the low voltage rating of the gate-source terminal, and the other is the large internal gate-resistance of SiC MOS-FET. The purpose of this work was to evaluate a proposed hybrid gate drive circuit that could ignore the internal gate-resistance and maintain the gate-source terminal stability of the SiC-MOSFET applications. It has been found that the proposed hybrid gate drive circuit can achieve faster and lower loss switching performance than conventional gate drive circuits by using the current source gate drive characteristics. In addition, the proposed gate drive circuit can use the voltage source gate drive characteristics to protect the gate-source terminals despite the low voltage rating of the SiC MOS-FET gate-source terminals.
引用
收藏
页码:834 / 843
页数:10
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