Wavelet-Based ADC Testing Automation Using LabView

被引：0
|
作者：
Akujuobi, C. M. [1 ]
Awada, E. [1 ]
机构：
[1] Prairie View A&M Univ, CECSTR, Prairie View, TX 77446 USA
来源：
INTERNATIONAL REVIEW OF ELECTRICAL ENGINEERING-IREE | 2008年 / 3卷 / 05期
关键词：
Analog-to-Digital Converters; Virtual Instruments; Effective Number of Bits; Differential Non-Linearity; Integral Non-Linearity; Full-Scale Range; and Discrete Wavelet Transform;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper discusses the development and implementation of wavelet-based automated mixed signal ADC testing. Lab View is used in the developments of the ADC testing algorithm. By using Lab View's (automation control software) as a choice of testing mixed signal systems, testing engineers can reduce testing lime and cost associated with it. The results prove that Lab View can be successfully used in the automation of mixed signal system testing. Copyright (C) 2008 Praise Worthy Prize S.r.l. - All rights reserved.
引用
收藏
页码：922 / 930
页数：9
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