X-ray laminography improves functional-test yield

被引：0
|
作者：
Bolliger, B [1 ]
Stewart, M [1 ]
机构：
[1] MITSUBISHI CONSUMER ELECT AMER,SANTA ANA,CA 92705
来源：
EE-EVALUATION ENGINEERING | 1996年 / 35卷 / 11期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：40 / 41
页数：2
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