X-ray laminography improves functional-test yield

被引：0

作者：

Bolliger, B ^{[1
]}

Stewart, M ^{[1
]}

机构：

[1] MITSUBISHI CONSUMER ELECT AMER,SANTA ANA,CA 92705

来源：

EE-EVALUATION ENGINEERING | 1996年 / 35卷 / 11期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：40 / 41

页数：2

共 50 条

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