Heavy ion elastic recoil detection analysis of AlxOy/Pt/AlxOy multilayer selective solar absorber

被引：22
|
作者：
Nuru, Z. Y. [1 ,2 ,4 ]
Msimanga, M. [5 ]
Arendse, C. J. [2 ]
Maaza, M. [1 ,3 ,4 ]
机构：
[1] Natl Res Fdn, iThemba LABS, Nanosci African Network NANOAFNET, ZA-7129 Somerset West, South Africa
[2] Univ Western Cape, Dept Phys, ZA-7535 Bellville, South Africa
[3] CSIR, ZA-0001 Pretoria, South Africa
[4] Univ South Africa UNISA, Coll Grad Studies, UNESCO UNISA Africa Chair Nanosci Nanotechnol, Pretoria, South Africa
[5] iThemba LABS Gauteng, ZA-2050 Johannesburg, South Africa
来源：
APPLIED SURFACE SCIENCE | 2014年 / 298卷
基金：
新加坡国家研究基金会;
关键词：
Depth profile; ERDA; Absorptance; Emittance; ERDA; RBS;
D O I：
10.1016/j.apsusc.2014.01.156
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
An AlxOy/Pt/AlxOy multilayer solar absorber for use in solar-thermal applications has been deposited onto copper substrate by electron beam (e-beam) vacuum evaporation at room temperature. Different samples were annealed at different temperatures in air and characterized by spectrophotometry, emissometry, heavy ion elastic recoil detection analysis (HI-ERDA), X-ray diffraction (XRD), and energy-dispersive Xray spectroscopy (EDS). The AlxOy/Pt/AlxOy multilayer solar absorbers heated up to 500 degrees C were found to exhibit good spectral selectivity (alpha/epsilon) of 0.951/0.08. However, beyond 500 degrees C the spectral selectivity decreased to 0.846/0.11, possibly due to thermally activated atomic interdiffusion profiles. HI-ERDA has been used to study depth-dependent atomic concentration profiles. These measurements revealed outward diffusion of the copper substrate towards the surface and therefore, the decrease in the constituents of the coating. The decrease in the intensity of Pt grains and formation of CuO and Cu2O phases at 700 degrees C were confirmed by XRD and EDS. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码：176 / 181
页数：6
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