Optical properties of pulsed-laser deposited ZnO thin films

被引：0
|
作者：
Bazavan, R. [1 ]
Ion, L. [1 ]
Socol, G. [2 ]
Enculescu, I. [3 ]
Bazavan, D. [1 ]
Tazlaoanu, C. [1 ]
Lorinczi, A. [3 ]
Mihailescu, I. N. [2 ]
Popescu, M. [3 ,4 ]
Antohe, S. [1 ]
机构：
[1] Univ Bucharest, Fac Phys, Magurele Ilfov 077125, Romania
[2] Natl Inst Lasers Plasma & Radiat Phys, Magurele Ilfov 077125, Romania
[3] Natl Inst Mat Phys, Magurele Ilfov 077125, Romania
[4] Fdn Horia Hulubei, Magurele Ilfov 077125, Romania
来源：
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2009年 / 11卷 / 04期
基金：
中国国家自然科学基金;
关键词：
ZnO; XRD; optical properties;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
ZnO thin films were deposited by pulsed laser deposition (PLD) technique on optical glass substrate. Structural analysis by X-ray diffraction revealed a wurtzite phase ZnO, highly textured, with (002) planes perpendicular to the growth direction. They were optically characterized by absorption and transmission spectrometry. The wavelength dependence of the refractive index was extracted from transmission data by using a numerical fitting procedure.
引用
收藏
页码：425 / 428
页数：4
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