Characterization of cleaved MgO(100) surfaces

被引：36

作者：

Abriou, D ^{[1
]}

Creuzet, F ^{[1
]}

Jupille, J ^{[1
]}

机构：

[1] CNRS,LAB ST GOBAIN SURFACE VERRE & INTERFACES,F-93303 AUBERVILLIERS,FRANCE

来源：

SURFACE SCIENCE | 1996年 / 352卷

关键词：

atomic force microscopy; magnesium oxides; single crystal surfaces; surface structure; X-ray photoelectron spectroscopy;

D O I：

10.1016/0039-6028(95)01187-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Cleaved MgO surfaces are characterized under ultra-high vacuum (UHV) conditions, by means of atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). To obtain well-defined samples, MgO crystals are cleaved under dry nitrogen, prior to being quickly inserted in UHV via a load-lock system. AFM images show 10 to 100 nm wide (100) terraces running over distances of microns. After either adsorption or contamination in UHV, cleaved MgO surfaces can be cleaned by heating samples at 1200 K under an oxygen pressure > 10(-3) Pa without inducing any visible change in the surface morphology. In contrast, the exposure to ambient air strongly affects these surfaces by irreversibly producing disordered similar to 10 X 10 nm(2) patches.

引用

页码：499 / 503

页数：5

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