Chemical derivatization technique in ToF-SIMS for quantification analysis of surface amine groups

A chemical derivatization technique in ToF-SIMS along with principal component analysis (PCA) were used to perform a quantitative study of the surface amine density of the plasma-polymerized ethylenediamine (PPEDA) thin film. We used the scores on principal component (PC) 1 from a PCA of ToF-SIMS data for the PPEDA films and their chemical-derivatized surfaces for comparison with the surface amine densities. These surface amine densities were independently determined by UV-visible spectroscopy. Our work found a good linear relationship between the surface amine densities and the scores on PC 1 from a PCA of the ToF-SIMS data for the chemical-derivatized PPEDA surfaces, but not for the PPEDA thin films themselves. In addition to quantification, our PCA results provided insights into the surface chemical composition of each surface. (c) 2006 Elsevier B.V. All rights reserved.