SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification

被引：0
|
作者：
Gijbels, R
Verlinden, G
Geuens, I
机构：
[1] Univ Antwerp, Dept Chem, Wilrijk, Belgium
[2] Agfa Gevaert NV, Res & Dev Labs, B-2640 Morstel, Belgium
来源：
MICROBEAM ANALYSIS 2000, PROCEEDINGS | 2000年 / 165期
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D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：331 / 332
页数：2
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