Disentangling degradation and auto-recovery of luminescence in Alq3 based organic light emitting diodes

被引:6
|
作者
Rao, K. Sudheendra [1 ,2 ]
Mohapatra, Y. N. [1 ,2 ,3 ]
机构
[1] Indian Inst Technol, Dept Phys, Kanpur 208016, Uttar Pradesh, India
[2] Indian Inst Technol, Samtel Ctr Display Technol, Kanpur 208016, Uttar Pradesh, India
[3] Indian Inst Technol, Mat Sci Programme, Kanpur 208016, Uttar Pradesh, India
关键词
Luminescence; Organic semiconductor; Degradation; Traps; ALLEVIATE OLED DEGRADATION; ENHANCED DEFECT REACTIONS; AMOLED PIXEL CIRCUIT; REVERSE-BIAS; SMALL-MOLECULE; MECHANISMS; BEHAVIOR; DIPOLES; DEVICES; DRIVE;
D O I
10.1016/j.jlumin.2013.08.067
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Organic semiconductor devices and materials have matured sufficiently to be limited by intrinsic degradation processes which are as yet not understood well. We use high quality Alq(3) based organic light emitting diodes to study the rate processes involved in degradation due to electrical stressing and its auto-recovery. The method involves interspersing degradation due to electrical pulsing with variable relaxation windows to monitor time evolution of loss and recovery of luminescence. The corresponding rate processes for permanent and auto-recoverable degradation is discussed on the basis of charging and discharging of traps, and a phenomenological model based on metastability in configuration-coordinate diagram is proposed. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:793 / 796
页数:4
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