共 50 条
- [32] TECHNIQUES IN HIGH-RESOLUTION COINCIDENCE COUNTING [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1956, 57 (03): : 119 - 129
- [35] Characterization of Black Carbon in Fine Aerosol Particles Using High Lateral Resolution TOF-SIMS [J]. Analytical Sciences, 2013, 29 : 479 - 481
- [39] Characterization of SiC epitaxial structures using high-resolution X-ray diffraction techniques [J]. SILICON CARBIDE AND RELATED MATERIALS 2003, PRTS 1 AND 2, 2004, 457-460 : 157 - 162