Growth of Biaxially-Textured La2Zr2O7 and Zr-doped CeO2 on Cold-Rolled Ni-W Substrate by CSD

The growth of oriented buffer layers by chemical solution deposition (CSD) on cube-textured Ni-based substrate is a key point for the development of low-cost YBa2Cu3O7-x (YBCO) coated conductor. Among the suitable compounds, La2Zr2O7 (LZO) and CeO2 are of particular interest as they enabled an all-chemical route for the fabrication of YBCO coated conductor. It has been recently shown that CSD films can be grown by direct precurson solution deposition on as-rolled, i.e., without cube orientation, metallic substrate. In particular, LZO film with biaxially {001}<110> texture has been successfully grown on either pure copper or Ni-W alloy substrate. In the present contribution, the deposition either LZO or Zr-doped CeO2 (CZO) on as-rolled Ni 3.5 at% W (Ni-W) substrate is reported. It is shown that film orientation enhances using low-roughness substrates, with an area fraction of {001}<110> oriented film as high as 96.4% for LZO and 95.4% for CZO. In both cases, the films are well adherent, without blister formation or delamination. Moreover, the film acts as a planarization layer, by smoothing Ni-W intrinsic roughness, also in correspondence of Ni-W grain boundary, where no grooving seems to appear on film surface.